Current Versus Voltage Characteristics of a Si Based 1-Diode Type Resistive Memory with Cr-SrTiO3 Films

نویسندگان

  • Min Yeong Song
  • Yujeong Seo
  • Yeon Soo Kim
  • Hee-Dong Kim
  • Ho-Myoung An
  • Tae Geun Kim
چکیده

In this paper, in order to suppress unwanted current paths originating from adjacent cells in a passive crossbar array based on resistive random access memory (RRAM) without extrinsic switching devices, 1-diode type RRAM which consists of a 0.2% chromium-doped strontium titanate (Cr-SrTiO3) film deposited on a silicon substrate, was proposed for high packing density, and intrinsic rectifying characteristics from the current versus voltage characteristics were successfully demonstrated.

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تاریخ انتشار 2011